Wafer Defect Detection Image Dataset
v3
Blur 15-
Generated on May 2, 2024
286 Total Images
View All ImagesDataset Split
Train Set 87%
248Images
Valid Set 9%
25Images
Test Set 5%
13Images
Preprocessing
Auto-Orient: Applied
Resize: Stretch to 640x640
Augmentations
Outputs per training example: 3
Blur: Up to 1.5px
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