waferdetection

Wafer Defect Detection

Classification

Wafer Defect Detection Image Dataset

v3

Blur 15-

Generated on May 2, 2024

Dataset Split

Train Set 87%
248Images
Valid Set 9%
25Images
Test Set 5%
13Images

Preprocessing

Auto-Orient: Applied
Resize: Stretch to 640x640

Augmentations

Outputs per training example: 3
Blur: Up to 1.5px