waferdetection

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Wafer Defect Detection

Classification

Wafer Defect Detection Image Dataset

Try Pre-Trained Model
Versions
Blur 15-
v3
May 2, 2024
Flip V - H
v2
May 2, 2024
Original
v1
May 1, 2024
v1

Original

Generated on May 1, 2024
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126 Total Images

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Dataset Split

Train Set 70%
88Images
Valid Set 20%
25Images
Test Set 10%
13Images

Preprocessing

Auto-Orient: Applied
Resize: Stretch to 640x640

Augmentations

No augmentations were applied.