Wafer Defect Detection_obj_detection_draft Computer Vision Project
waferdetection
Updated 7 months ago
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Classes (37)
Center
Center-Edge_Loc
Center-Edge_Loc-Loc
Center-Edge_Loc-Loc-Scratch
Center-Edge_Loc-Scratch
Center-Edge_Ring
Center-Edge_Ring-Loc
Center-Edge_Ring-Loc-Scratch
Center-Edge_Ring-Scratch
Center-Loc
Center-Loc-Scratch
Center-Scratch
Donut Donut-Edge_Loc
Donut-Edge_Loc-Loc
Donut-Edge_Loc-Loc-Scratch
Donut-Edge_Loc-Scratch
Donut-Edge_Ring
Donut-Edge_Ring-Loc
Donut-Edge_Ring-Loc-Scratch
Donut-Edge_Ring-Scratch
Donut-Loc
Donut-Loc-Scratch
Donut-Scratch
Edge_Loc
Edge_Loc-Loc
Edge_Loc-Loc-Scratch
Edge_Loc-Scratch
Edge_Ring
Edge_Ring-Loc
Edge_Ring-Loc-Scratch
Edge_Ring-Scratch
Loc
Loc-Scratch
Near_Full
Normal Scratch Metrics
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LICENSE
CC BY 4.0 If you use this dataset in a research paper, please cite it using the following BibTeX:
@misc{
wafer-defect-detection_obj_detection_draft_dataset,
title = { Wafer Defect Detection_obj_detection_draft Dataset },
type = { Open Source Dataset },
author = { waferdetection },
howpublished = { \url{ https://universe.roboflow.com/waferdetection/wafer-defect-detection_obj_detection_draft } },
url = { https://universe.roboflow.com/waferdetection/wafer-defect-detection_obj_detection_draft },
journal = { Roboflow Universe },
publisher = { Roboflow },
year = { 2024 },
month = { may },
note = { visited on 2024-11-21 },
}