Wafer Defect Detection Dataset
v2
Flip V - H
Generated on May 2, 2024
238 Total Images
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Dataset Split
Train Set 84%
200Images
Valid Set 11%
25Images
Test Set 5%
13Images
Preprocessing
Auto-Orient: Applied
Resize: Stretch to 640x640
Augmentations
Outputs per training example: 3
Flip: Horizontal, Vertical