Wafer Defect Computer Vision Project

Wafer

Updated 2 years ago

723

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33

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Classes (7)
BLOCK ETCH
COATING BAD
PARTICLE
PIQ PARTICLE
PO CONTAMINATION
SCRATCH
SEZ BURNT

Metrics

mAP
72.5%
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LICENSE
CC BY 4.0

If you use this dataset in a research paper, please cite it using the following BibTeX:

                        
@misc{ wafer-defect-rv1vx_dataset, title = { Wafer Defect Dataset }, type = { Open Source Dataset }, author = { Wafer }, howpublished = { \url{ https://universe.roboflow.com/wafer-irhuv/wafer-defect-rv1vx } }, url = { https://universe.roboflow.com/wafer-irhuv/wafer-defect-rv1vx }, journal = { Roboflow Universe }, publisher = { Roboflow }, year = { 2023 }, month = { aug }, note = { visited on 2025-04-02 }, }