Wafer

Wafer Defect

Instance Segmentation

Wafer Defect Computer Vision Project

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Trained Model API

This project has a trained model available that you can try in your browser and use to get predictions via our Hosted Inference API and other deployment methods.

Cite This Project

If you use this dataset in a research paper, please cite it using the following BibTeX:

@misc{
                            wafer-defect-rv1vx_dataset,
                            title = { Wafer Defect Dataset },
                            type = { Open Source Dataset },
                            author = { Wafer },
                            howpublished = { \url{ https://universe.roboflow.com/wafer-irhuv/wafer-defect-rv1vx } },
                            url = { https://universe.roboflow.com/wafer-irhuv/wafer-defect-rv1vx },
                            journal = { Roboflow Universe },
                            publisher = { Roboflow },
                            year = { 2023 },
                            month = { aug },
                            note = { visited on 2024-03-02 },
                            }
                        

Connect Your Model With Program Logic

Find utilities and guides to help you start using the Wafer Defect project in your project.

Source

Wafer

Last Updated

7 months ago

Project Type

Instance Segmentation

Subject

wafer-defect

Classes

BLOCK ETCH COATING BAD PARTICLE PIQ PARTICLE PO CONTAMINATION SCRATCH SEZ BURNT

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License

CC BY 4.0