test Computer Vision Project
test
Updated 2 months ago
Classes (52)
+
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0
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A defect will be classified as Bump Defect if :
A defect will be classified as Bump surface damage if :
A defect will be classified as Die top sise chip/peeling if :
A defect will be classified as Particle if :
Adaptive Histogram Mode
AdaptiveHistogram
Area(um2) is greater than or equal to
Big Area Status - Bright {area , μ}
Big Area Status - Dark {area , μ}
Bright Zone CD Percent
Brightness is between
Classification
Cluster Area {area , μ}
Cluster Diameter {μ}
Cluster Distance {μ}
CollectForGlobalSum
Contrast Delta - Bright
Contrast Delta - Dark
Contrast Factor - Bright
Contrast Factor - Dark
Contrast Upper value - Bright
Contrast lower value - Dark
Dark Zone CD Percent
Defects will be classified in the following order:
E
MaxAreaSum
MaxCountSum
Min Defect Area - Bright {area , μ}
Min Defect Area - Dark {area , μ}
Min Defect Length - Bright {μ}
Min Defect Length - Dark {μ}
Min Defect Width - Bright
Min Defect Width - Dark
Rich Events Cluster - Max Distance {μ}
Rich Events Cluster Unite Polarities
Size(um) is greater than or equal to
X Size(um) is greater than or equal to
Y Size(um) is greater than or equal to
Zone CD Radius
and
Metrics
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Cite This Project
LICENSE
CC BY 4.0 If you use this dataset in a research paper, please cite it using the following BibTeX:
@misc{
test-n1tx0_dataset,
title = { test Dataset },
type = { Open Source Dataset },
author = { test },
howpublished = { \url{ https://universe.roboflow.com/test-01ndi/test-n1tx0 } },
url = { https://universe.roboflow.com/test-01ndi/test-n1tx0 },
journal = { Roboflow Universe },
publisher = { Roboflow },
year = { 2024 },
month = { sep },
note = { visited on 2024-11-10 },
}