wafer map defect classification Computer Vision Project
RACHID ZAGHDOUDI
Updated 5 months ago
A description for this project has not been published yet.
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LICENSE
CC BY 4.0 If you use this dataset in a research paper, please cite it using the following BibTeX:
@misc{
wafer-map-defect-classification_dataset,
title = { wafer map defect classification Dataset },
type = { Open Source Dataset },
author = { RACHID ZAGHDOUDI },
howpublished = { \url{ https://universe.roboflow.com/rachid-zaghdoudi-n5xxx/wafer-map-defect-classification } },
url = { https://universe.roboflow.com/rachid-zaghdoudi-n5xxx/wafer-map-defect-classification },
journal = { Roboflow Universe },
publisher = { Roboflow },
year = { 2024 },
month = { jul },
note = { visited on 2024-12-18 },
}