Ailab

wafer defect detection

Object Detection

Roboflow Universe Ailab wafer defect detection

wafer defect detection Computer Vision Project

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Cite This Project

If you use this dataset in a research paper, please cite it using the following BibTeX:

@misc{
                            wafer-defect-detection_dataset,
                            title = { wafer defect detection Dataset },
                            type = { Open Source Dataset },
                            author = { Ailab },
                            howpublished = { \url{ https://universe.roboflow.com/ailab-lobb3/wafer-defect-detection } },
                            url = { https://universe.roboflow.com/ailab-lobb3/wafer-defect-detection },
                            journal = { Roboflow Universe },
                            publisher = { Roboflow },
                            year = { 2023 },
                            month = { jan },
                            note = { visited on 2024-06-29 },
                            }
                        

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Source

Ailab

Last Updated

a year ago

Project Type

Object Detection

Subject

crack-particles

Views: 26

Views in previous 30 days: 1

Downloads: 2

Downloads in previous 30 days: 0

License

Public Domain

Classes

crease scratches