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Related Objects of Interest: cell break , dendritic crack , edge chip , finger break , hot spot , line crack , poor soldering , scratch , acid etch , contact resitasnce
Top Chip Datasets and Models
The datasets below can be used to train fine-tuned models for chip detection. You can explore each dataset in your browser using Roboflow and export the dataset into one of many formats.
At the bottom of this page, we have guides on how to train a model using the chip datasets below.
1.3k images 61 classes 8 models
9.8k images 100 classes 1 model
125 images 69 classes 2 models
53 images 4 classes 3 models
811 images 7 classes
324 images 23 classes
0 1 2 3 4 5 6 7 8 9 A defect will be classified as Bump Defect if : A defect will be classified as Bump surface damage if : A defect will be classified as Die top sise chip/peeling if : A defect will be classified as Frontside Defect if : A defect will be classified as Particle if : Area(um2) is greater than or equal to Brightness is between Defects will be classified in the following order: Size(um) is greater than or equal to X Size(um) is greater than or equal to
61 images 7 classes 3 models
61 images 7 classes 3 models
811 images 7 classes
80 images 5 classes
961 images 10 classes
961 images 10 classes 6 models
105 images 7 classes
35 images 37 classes
150 images 17 classes 1 model
402 images 90 classes